Wafer-Level Reliability (WLR) Test Software Evaluation Request
Request the WLR Software Evaluation
Wafer-Level Reliability (WLR) Test Software gives you access to NI’s WLR test system that reduces cycle time and increases data insight velocity. The application software includes a test sequencer, device mapping, lot configuration tool, operator interface, and more
Please complete the contact information form and we’ll review your request and respond within 3 business days to notify you if you’ve been approved for the evaluation of WLR Test software.